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    Please use this identifier to cite or link to this item: http://ccur.lib.ccu.edu.tw/handle/A095B0000Q/474

    Title: 建構薄膜電晶體液晶面板顯示器之面板工程One Drop Filling製程良率預測模式;Construction of thin film transistor LCD panel display end One Drop Filling Process Forecasting Mode
    Authors: 鄭進福;ZHENG, JIN-FU
    Contributors: 資訊管理學系碩士在職專班
    Keywords: TFT-LCD面板ODF製程;工業4.0;維度縮減;資料探勘;TFT-LCD panel ODF process;Industry 4.0;dimension reduction;data mining
    Date: 2017
    Issue Date: 2019-07-17
    Publisher: 資訊管理學系碩士在職專班
    Abstract: 過去台灣引以為傲TFT-LCD光電產業,面對全球化的競爭者與產業特性快速輪動的景氣影響,正一步步的面臨產業生存危機,而國內各家業者無不卯足全力開發新的應用技術或是新式製程技術來應付這詭譎多變的產業,但正國內外各家廠商拚新式技術突破時,是否該反饋自我品質良率的精進提升。生產良率一直都是生產事業的主要競爭力,它攸關生產者各種成本的稼動率,也是企業經營重要成敗關健因素之一,因此如何提升良率產業競爭性,這是每個生產者所該面對重要的課題。因此TFT-LCD面板產業如上述所言面臨嚴峻挑戰,除了自我產品規格技術提升外,更應該從提升品質良率基本功夫紮根做起,而ODF製程更是TFT-LCD產業最末端的玻璃關鍵製程,生產的良率攸關整體TFT-LCD生產成本達5成以上。如何透過提昇製程良率來增加產業競爭力,藉由優化生產流程或機台參數的改善以提昇生產良率增加生產效能,才能在這艱苛的市場狀況下生存。本研究是藉由工業4.0的資料探勘技術,對於生產中小尺寸TFT-LCD面板公司,現有的實際製程參數設定資料,針對每道製程,分別以不同的屬性選取進行研究變項分析進而找出影響良率關鍵要素進行探討。首先從研究對象工程資料庫,所儲存的資料,由專家依經驗法則挑選針對研究議題的一組屬性集合,接下來由weka.attributeSelection.GainRatioAttributeEval模組挑選影響研究議題屬性變項,最後匯整參考文獻中影響研究議題良率屬性因子,再以這三種維度縮減方式所建構的研究變項資料為基礎。在所有的研究變項經過資料前處理完畢之後,分別將三組研究變項,透過資料探勘四種分類技術,再來進行影響良率關鍵要素預測的分析及探討影響屬性隱藏知識。關鍵詞:TFT-LCD面板ODF製程、工業4.0、維度縮減、資料探勘。
    In the past decades, Taiwan was proud of TFT-LCD optoelectronics industry. Nowadays, facing international competitors and industry characteristics influenced by the economy of rapid globalization wheeled, it encounter survival crisis. For the crucial moment, various domestic industries are taking efforts to develop new the application of new technology or process technology to deal with this strange and varied industry. However, while domestic and foreign manufacturers are trying to breakthroughs, should the self-quality feedback to be considered to enhance the yield of production? Production yield is major competitiveness to production business. It not only influences utilization rate of various cost producers, but also roles the key business success factor. Therefore, how to enhance the competitiveness of the industrial yield is the important issue that every producer needs to face. Like discussed above, TFT-LCD panel industry is facing critical challenges. In addition to the technical specifications of self-promotion, to improve the quality basic yield should start from the fundamental. The ODF process is the extreme end of the TFT-LCD industry Glass critical process, and the production yield of TFT-LCD production influence overall cost more than 50%. How to increase industrial competitiveness by improving the process yield, improve the production yield and increase production efficiency by optimizing the production process or machine parameters is the key to survive in this strict and difficult market.This study is designed based on the data mining technology of industry 4.0. Small and medium size TFT-LCD panel manufacturer as target, through the current process parameters settings for each process, select study variables by different respectively attributes, and find out the key elements that impact the yield.First of all, getting data from researched object, select one set of attributes for the study target by Expert rule of thumb. Next, select impacting research topic attribute variables by weka.attributeSelection.GainRatioAttributeEval module. Finally, compile yield influenced factors from references, and then construct these three dimension reduction methods based on the result.After all research variables are pre-processed, take three sets of study variables, analyze and explore the impact of property hidden knowledge through data mining techniques four categories.Keywords: TFT-LCD panel ODF process, Industry 4.0, dimension reduction, data mining.
    Appears in Collections:[資訊管理系研究所] 學位論文

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