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    Please use this identifier to cite or link to this item: http://ccur.lib.ccu.edu.tw/handle/A095B0000Q/625


    Title: 臺灣半導體產業之專利品質分析;An Empirical Analysis on the Patent Quality of the Taiwanese Semiconductor Industry
    Authors: 葉芳妤;YEH, FANG-YU
    Contributors: 經濟系國際經濟學研究所
    Keywords: 半導體;專利資訊;卜瓦松擬最大概似估計法;patent quality;semiconductor;Poisson Pseudo-Maximum Likelihood(PPML)
    Date: 2017
    Issue Date: 2019-07-17
    Publisher: 經濟系國際經濟學研究所
    Abstract: 本文以1990年至2014年為樣本研究期間,觀察139家臺灣半導體廠商於美國專利商標局申請核准之專利,以卜瓦松擬最大概似法進行分析,探討廠商特性及專利資訊如何影響廠商之專利品質,針對專利品質模型中使用的專利前引證次數與專利申請國家數,分別採用可數資料模型中之零膨脹負二項模型與卜瓦松模型進行估計。實證結果顯示,外國人參與、專利範圍數、研發密集度和稅後淨利率對專利品質有顯著正向影響。
    In this study, we analyze the patent citations data of 139 Taiwanese semiconductor firms in United States Patent and Trademark Office(USPTO) database during the period 1990-2014 to investigate possible determinants of patent quality in the semiconductor industry from the aspects of firm characteristics and patent information released. The empirical results from the Poisson Pseudo-Maximum Likelihood(PPML)analysis of zero-inflated negative binomial model and Poisson model find that cross-border invention, claims, R&D intensity and net profit margin do affect the quality of patent positively.
    Appears in Collections:[經濟系國際經濟學研究所] 學位論文

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